Analysis of Pattern Generation and Randomness for LFSRs

The main goal of genetic programming is to get best pattern in terms of randomness. There are various methods for random pattern generation. The patterns generated in this paper are pseudo-random in nature. Different types of linear feedback shift register (LFSR) are used to generate pseudo-random patterns and test their randomness by various testing algorithms. Random patterns are compared according to their p-value which is achieved from different testing algorithms. Hence, the goal is to get the best pattern in terms of randomness. The objective of this paper is to explore statistical tests for detection of randomness in a true random number generator that may be used in designing genetic processor.